conc26uuu.info
26uuu.info 时间:2021-04-07 阅读:()
ICP-OESandICP-MSDetectionLimitGuidance2007EvansAnalyticalGroup,LLCPrintedinUSA08/07BR0233Li5AtomicNumberSymbolICP-OESSolutionDL(g/L)2.
5ICP-OESSolidDL(ppmwt)29Cu11Na12Mg13Al14Si15P16S17Cl18Ar1H4Be37Rb55Cs42Mo41Nb86Rn74W43Tc75Re44Ru76Os45Rh77Ir46Pd78Pt47Ag79Au48Cd80Hg60Nd62Sm63Eu64Gd65Tb61Pm66Dy67Ho68Er69Tm49In50Sn51Sb52Te53I81Tl82Pb83Bi84Po85At58Ce59Pr70Yb90Th92U93Np94Pu95Am96Cm91Pa97Bk98Cf99Es100Fm101Md102No105107106108109111110112DbSgHsBhMtUunUuu1141163Li10Ne2He9O8F7N6C5B57La89Ac71Lu103Lr87Fr88Ra104Rf72Hf40Zr39Y38Sr56Ba73Ta54Xe19K20Ca21Sc22Ti30Zn31Ga32Ge33As34Se35Br36Kr23V24Cr25Mn26Fe27Co28NiUubUuqUuhPeriod1654327LanthanidesActinidesGroup1IA2IIA3IIIB4IVB5VB6VIB7VIIB9VIII81011IB12IIB13IIIA14IVA15VA16VIA17VIIA18VIIIAToconvertg/Ltoppmwt,usethefollowingcalculation:[solconc(g/L)*prepvol(L)]/samplemass(g)=sampleconcentrationinppmwt(mg/Kg)0.
1gICP-OESsamplemass50mlICP-OESprepvolume1SolutiondilutiontorunonICP-OES500TypicalICP-OESdilutionfactor0.
05gICP-MSsamplemass100mlICP-MSprepvolume1SolutiondilutiontorunonICP-MS2,000TypicalICP-MSdilutionfactorThedetectionlimitsaretheoreticalbestcasescenariosassumingtherearenospectralinterferencesaffectingthebestisotopeorwavelengthforagivenelement.
Foranygivendetermination,theactualmethoddetectionlimitcanbeanorderofmagnitudehigherormore.
Usethisasaguide,notabsoluteinformation0.
005ICP-MSSolutionDL(g/L)0.
01ICP-MSSolidDL(ppmwt)512.
50.
50.
0050.
00050.
010.
001500.
5250.
250.
010.
0010.
020.
0021000.
5500.
250.
050.
0050.
10.
01100.
550.
250.
0010.
0010.
0020.
002400000.
5200000.
250.
00050.
00050.
0010.
0011050.
050.
12020501010250.
001510.
0021025555155555505050502.
52.
52.
52.
50.
52.
52.
52.
52.
52.
5252525250.
0050.
0010.
00050.
00050.
00050.
0020.
00050.
0020.
00050.
0010.
00050.
0040.
0010.
0020.
010.
0020.
0010.
0010.
0010.
0040.
0010.
0040.
0010.
0020.
0010.
0080.
0020.
004555010501005055505050502.
52.
52552550252.
52.
5252525250.
00050.
00050.
0010.
00050.
00050.
00050.
00050.
00050.
00050.
00050.
010.
00050.
0050.
0010.
0010.
0020.
0010.
0010.
0010.
0010.
0010.
0010.
0010.
020.
0010.
0110505050101505050505050100525252550.
5252525252525500.
00050.
0050.
00050.
0010.
00050.
0010.
00050.
00050.
00050.
0010.
0010.
00050.
00050.
0010.
010.
0010.
0020.
0010.
0020.
0010.
0010.
0010.
0020.
0020.
0010.
0015050505010505010101010101025252525525255555550.
00050.
00050.
00050.
00050.
00050.
00050.
00050.
00050.
00050.
00050.
00050.
00050.
00050.
0010.
0010.
0010.
0010.
0010.
0010.
0010.
0010.
0010.
0010.
0010.
0010.
00150500252500.
00050.
00050.
0010.
0012007EvansAnalyticalGroup,LLCPrintedinUSA08/07BR023InductivelyCoupledPlasmaSpectroscopyEAGLocationsUnitedStatesArizona903S.
RuralRoad,#101-388Tempe,AZ85281480239-0602602470-2655Faxinfo.
az@eaglabs.
comCalifornia810KiferRoadSunnyvale,CA94086408530-3500408530-3501Faxinfo.
ca@eaglabs.
com1135E.
ArquesAvenueSunnyvale,CA94085408738-3033408738-3035Fax785LucerneDriveSunnyvale,CA94085408737-3892408737-3916FaxMassachusetts10CentennialDrivePeabody,MA01960978278-9500978278-9501Faxinfo.
ma@eaglabs.
comMinnesota18725LakeDriveEastChanhassen,MN55317952828-6411952828-6449Faxinfo.
mn@eaglabs.
comNewJersey104WindsorCenterDr.
,Ste.
101EastWindsor,NJ08520609371-4800609371-5666Faxinfo.
nj@eaglabs.
comNewYorkSHIVATechnologies6707BrooklawnParkwaySyracuse,NY1321131543199003154319800Faxinfo.
ny@eaglabs.
comNorthCarolina616HuttonSt.
,Ste.
101Raleigh,NC27606919829-7041919829-5518Faxinfo.
nc@eaglabs.
comTexas425RoundRockWestDr.
,Ste.
100RoundRock,TX78681512671-9500512671-9501Faxinfo.
tx@eaglabs.
comInternationalLocationsEvansAnalyticalGroup-ShanghaiSte.
102,Building44,1387ZhangdongRoadPudongArea,Shanghai,China201204862168796088862168799086Faxinfo.
cn@eaglabs.
comShivaTechnologiesEuropeSAS94,chemindelaPeyrette31170Tournefeuille,France3356173152933561731567Faxinfo.
fr@eaglabs.
comCascadeScienticGmbHIndustrieparkHchst,BuildingG865D-65926FrankfurtamMain,Germany49(0)69305321349(0)69307941Faxinfo.
de@eaglabs.
comNanoScienceCorporation7F,SumitomoBldg.
,HigashiIkebukuro1-10-1Toshima-Ku,Tokyo170-0013,Japan8135396053181353961930Faxinfo.
jp@eaglabs.
comEvansTaiwanLLC5F-1,No.
31PuDingRoadHsinChu,Taiwan,300R.
O.
C.
8863563230388635632306Faxinfo.
tw@eaglabs.
comCascadeScienticLtd.
ETCBuildingBrunelScienceParkUxbridgeUB83PH,U.
K.
44(0)189581119444(0)1895810350Faxinfo.
uk@eaglabs.
comWWW.
EAGLABS.
COMInductivelyCoupledPlasmaSpectroscopytechniquesare"wet"samplingmethodswheresamplesareintroducedinliquidformforanalysis.
Inplasmaemissionspectroscopy(OES),asamplesolutionisintroducedintothecoreofinductivelycoupledargonplasma(ICP),whichgeneratestemperatureofapproximately8000°C.
Atthistemperatureallelementsbecomethermallyexcitedandemitlightattheircharacteristicwavelengths.
Thislightiscollectedbythespectrometerandpassesthroughadiffractiongratingthatservestoresolvethelightintoaspectrumofitsconstituentwavelengths.
Withinthespectrometer,thisdiffractedlightisthencollectedbywave-lengthandampliedtoyieldanintensitymeasurementthatcanbeconvertedtoanelementalconcentrationbycomparisonwithcalibrationstandards.
Inplasmamassspectroscopy(MS),theinductivelycoupledargonplasma(ICP)isonceagainusedasanexcitationsourcefortheelementsofinterest.
HoweverincontrasttoOES,theplasmainICP-MSisusedtogenerateionsthatarethenintroducedtothemassanalyzer.
Theseionsarethenseparatedandcollectedaccordingtotheirmasstochargeratios.
Theconstituentsofanunknownsamplecanthenbeidentiedandmeasured.
ICP-MSoffersextremelyhighsensitivitytoawiderangeofelements.
StrengthsLimitationsUpto70elementscanbedeterminedsimultaneouslyinasinglesampleanalysis.
Theemissionspectraarecomplexandinter-elementinterferencesarepossibleifthewave-lengthoftheelementofinterestisveryclosetothatofanotherelement.
Theusefulworkingrangeisoverseveralordersofmagnitude.
DuringMassSpectrometry,thecommonmatrixelementsandothermolecularspeciescaninterferewiththemeasurementofsomeelements.
Doublychargedormolecularionicspeciescancreatedifcultiesinquantications.
Instrumentationissuitabletoautomation,thusenhancingaccuracy,precisionandthroughput.
Thesampletobeanalyzedmustbedigestedpriortoanalysisinordertodissolvetheelement(s)ofinterest.
5ICP-OESSolidDL(ppmwt)29Cu11Na12Mg13Al14Si15P16S17Cl18Ar1H4Be37Rb55Cs42Mo41Nb86Rn74W43Tc75Re44Ru76Os45Rh77Ir46Pd78Pt47Ag79Au48Cd80Hg60Nd62Sm63Eu64Gd65Tb61Pm66Dy67Ho68Er69Tm49In50Sn51Sb52Te53I81Tl82Pb83Bi84Po85At58Ce59Pr70Yb90Th92U93Np94Pu95Am96Cm91Pa97Bk98Cf99Es100Fm101Md102No105107106108109111110112DbSgHsBhMtUunUuu1141163Li10Ne2He9O8F7N6C5B57La89Ac71Lu103Lr87Fr88Ra104Rf72Hf40Zr39Y38Sr56Ba73Ta54Xe19K20Ca21Sc22Ti30Zn31Ga32Ge33As34Se35Br36Kr23V24Cr25Mn26Fe27Co28NiUubUuqUuhPeriod1654327LanthanidesActinidesGroup1IA2IIA3IIIB4IVB5VB6VIB7VIIB9VIII81011IB12IIB13IIIA14IVA15VA16VIA17VIIA18VIIIAToconvertg/Ltoppmwt,usethefollowingcalculation:[solconc(g/L)*prepvol(L)]/samplemass(g)=sampleconcentrationinppmwt(mg/Kg)0.
1gICP-OESsamplemass50mlICP-OESprepvolume1SolutiondilutiontorunonICP-OES500TypicalICP-OESdilutionfactor0.
05gICP-MSsamplemass100mlICP-MSprepvolume1SolutiondilutiontorunonICP-MS2,000TypicalICP-MSdilutionfactorThedetectionlimitsaretheoreticalbestcasescenariosassumingtherearenospectralinterferencesaffectingthebestisotopeorwavelengthforagivenelement.
Foranygivendetermination,theactualmethoddetectionlimitcanbeanorderofmagnitudehigherormore.
Usethisasaguide,notabsoluteinformation0.
005ICP-MSSolutionDL(g/L)0.
01ICP-MSSolidDL(ppmwt)512.
50.
50.
0050.
00050.
010.
001500.
5250.
250.
010.
0010.
020.
0021000.
5500.
250.
050.
0050.
10.
01100.
550.
250.
0010.
0010.
0020.
002400000.
5200000.
250.
00050.
00050.
0010.
0011050.
050.
12020501010250.
001510.
0021025555155555505050502.
52.
52.
52.
50.
52.
52.
52.
52.
52.
5252525250.
0050.
0010.
00050.
00050.
00050.
0020.
00050.
0020.
00050.
0010.
00050.
0040.
0010.
0020.
010.
0020.
0010.
0010.
0010.
0040.
0010.
0040.
0010.
0020.
0010.
0080.
0020.
004555010501005055505050502.
52.
52552550252.
52.
5252525250.
00050.
00050.
0010.
00050.
00050.
00050.
00050.
00050.
00050.
00050.
010.
00050.
0050.
0010.
0010.
0020.
0010.
0010.
0010.
0010.
0010.
0010.
0010.
020.
0010.
0110505050101505050505050100525252550.
5252525252525500.
00050.
0050.
00050.
0010.
00050.
0010.
00050.
00050.
00050.
0010.
0010.
00050.
00050.
0010.
010.
0010.
0020.
0010.
0020.
0010.
0010.
0010.
0020.
0020.
0010.
0015050505010505010101010101025252525525255555550.
00050.
00050.
00050.
00050.
00050.
00050.
00050.
00050.
00050.
00050.
00050.
00050.
00050.
0010.
0010.
0010.
0010.
0010.
0010.
0010.
0010.
0010.
0010.
0010.
0010.
00150500252500.
00050.
00050.
0010.
0012007EvansAnalyticalGroup,LLCPrintedinUSA08/07BR023InductivelyCoupledPlasmaSpectroscopyEAGLocationsUnitedStatesArizona903S.
RuralRoad,#101-388Tempe,AZ85281480239-0602602470-2655Faxinfo.
az@eaglabs.
comCalifornia810KiferRoadSunnyvale,CA94086408530-3500408530-3501Faxinfo.
ca@eaglabs.
com1135E.
ArquesAvenueSunnyvale,CA94085408738-3033408738-3035Fax785LucerneDriveSunnyvale,CA94085408737-3892408737-3916FaxMassachusetts10CentennialDrivePeabody,MA01960978278-9500978278-9501Faxinfo.
ma@eaglabs.
comMinnesota18725LakeDriveEastChanhassen,MN55317952828-6411952828-6449Faxinfo.
mn@eaglabs.
comNewJersey104WindsorCenterDr.
,Ste.
101EastWindsor,NJ08520609371-4800609371-5666Faxinfo.
nj@eaglabs.
comNewYorkSHIVATechnologies6707BrooklawnParkwaySyracuse,NY1321131543199003154319800Faxinfo.
ny@eaglabs.
comNorthCarolina616HuttonSt.
,Ste.
101Raleigh,NC27606919829-7041919829-5518Faxinfo.
nc@eaglabs.
comTexas425RoundRockWestDr.
,Ste.
100RoundRock,TX78681512671-9500512671-9501Faxinfo.
tx@eaglabs.
comInternationalLocationsEvansAnalyticalGroup-ShanghaiSte.
102,Building44,1387ZhangdongRoadPudongArea,Shanghai,China201204862168796088862168799086Faxinfo.
cn@eaglabs.
comShivaTechnologiesEuropeSAS94,chemindelaPeyrette31170Tournefeuille,France3356173152933561731567Faxinfo.
fr@eaglabs.
comCascadeScienticGmbHIndustrieparkHchst,BuildingG865D-65926FrankfurtamMain,Germany49(0)69305321349(0)69307941Faxinfo.
de@eaglabs.
comNanoScienceCorporation7F,SumitomoBldg.
,HigashiIkebukuro1-10-1Toshima-Ku,Tokyo170-0013,Japan8135396053181353961930Faxinfo.
jp@eaglabs.
comEvansTaiwanLLC5F-1,No.
31PuDingRoadHsinChu,Taiwan,300R.
O.
C.
8863563230388635632306Faxinfo.
tw@eaglabs.
comCascadeScienticLtd.
ETCBuildingBrunelScienceParkUxbridgeUB83PH,U.
K.
44(0)189581119444(0)1895810350Faxinfo.
uk@eaglabs.
comWWW.
EAGLABS.
COMInductivelyCoupledPlasmaSpectroscopytechniquesare"wet"samplingmethodswheresamplesareintroducedinliquidformforanalysis.
Inplasmaemissionspectroscopy(OES),asamplesolutionisintroducedintothecoreofinductivelycoupledargonplasma(ICP),whichgeneratestemperatureofapproximately8000°C.
Atthistemperatureallelementsbecomethermallyexcitedandemitlightattheircharacteristicwavelengths.
Thislightiscollectedbythespectrometerandpassesthroughadiffractiongratingthatservestoresolvethelightintoaspectrumofitsconstituentwavelengths.
Withinthespectrometer,thisdiffractedlightisthencollectedbywave-lengthandampliedtoyieldanintensitymeasurementthatcanbeconvertedtoanelementalconcentrationbycomparisonwithcalibrationstandards.
Inplasmamassspectroscopy(MS),theinductivelycoupledargonplasma(ICP)isonceagainusedasanexcitationsourcefortheelementsofinterest.
HoweverincontrasttoOES,theplasmainICP-MSisusedtogenerateionsthatarethenintroducedtothemassanalyzer.
Theseionsarethenseparatedandcollectedaccordingtotheirmasstochargeratios.
Theconstituentsofanunknownsamplecanthenbeidentiedandmeasured.
ICP-MSoffersextremelyhighsensitivitytoawiderangeofelements.
StrengthsLimitationsUpto70elementscanbedeterminedsimultaneouslyinasinglesampleanalysis.
Theemissionspectraarecomplexandinter-elementinterferencesarepossibleifthewave-lengthoftheelementofinterestisveryclosetothatofanotherelement.
Theusefulworkingrangeisoverseveralordersofmagnitude.
DuringMassSpectrometry,thecommonmatrixelementsandothermolecularspeciescaninterferewiththemeasurementofsomeelements.
Doublychargedormolecularionicspeciescancreatedifcultiesinquantications.
Instrumentationissuitabletoautomation,thusenhancingaccuracy,precisionandthroughput.
Thesampletobeanalyzedmustbedigestedpriortoanalysisinordertodissolvetheelement(s)ofinterest.
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