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MAX4614RELIABILITYREPORTFORMAX4614CUD+PLASTICENCAPSULATEDDEVICESJune28,2010MAXIMINTEGRATEDPRODUCTS120SANGABRIELDR.
SUNNYVALE,CA94086Approvedby'RQ/LSSVQualityAssurance0DQDJHr,ReliabilityEngineeringMaximIntegratedProducts.
Allrightsreserved.
Page1/5MAX4614ConclusionTheMAX4614CUD+successfullymeetsthequalityandreliabilitystandardsrequiredofallMaximproducts.
Inaddition,Maxim"scontinuousreliabilitymonitoringprogramensuresthatalloutgoingproductwillcontinuetomeetMaxim"squalityandreliabilitystandards.
TableofContentsI.
DeviceDescriptionV.
QualityAssuranceInformationII.
ManufacturingInformationVI.
ReliabilityEvaluationIII.
PackagingInformationIV.
DieInformation.
.
.
.
.
AttachmentsI.
DeviceDescriptionA.
GeneralTheMAX4614/MAX4615/MAX4616quad,low-voltage,high-speed,single-pole/single-throw(SPST)analogswitchesarepincompatiblewiththeindustry-standard74HC4066/MAX4610analogswitches.
On-resistance(10max)ismatchedbetweenswitchesto1maxandisflat(1max)overthespecifiedsignalrange.
EachswitchhandlesV+toGNDanalogsignallevels.
Maximumoff-leakagecurrentisonly1nAatTA=+25°Cand6nAatTA=+85°C.
TheMAX4614hasfournormallyopen(NO)switches,andtheMAX4615hasfournormallyclosed(NC)switches.
TheMAX4616hastwoNOswitchesandtwoNCswitches.
TheseCMOSswitchesoperatefromasingle+2Vto+5.
5Vsupply.
Alldigitalinputshave+0.
8Vand+2.
4Vlogicthresholds,ensuringTTL/CMOS-logiccompatibilitywhenusingasingle+5Vsupply.
MaximIntegratedProducts.
Allrightsreserved.
Page2/5MAX4614II.
ManufacturingInformationA.
Description/Function:Low-Voltage,High-Speed,Quad,SPSTCMOSAnalogSwitchesB.
Process:TS60C.
NumberofDeviceTransistors:D.
FabricationLocation:TaiwanE.
AssemblyLocation:Malaysia,Philippines,ThailandF.
DateofInitialProduction:July24,1999III.
PackagingInformationA.
PackageType:14-pinTSSOPB.
LeadFrame:CopperC.
LeadFinish:100%matteTinD.
DieAttach:ConductiveE.
Bondwire:Au(1mildia.
)F.
MoldMaterial:EpoxywithsilicafillerG.
AssemblyDiagram:#05-1201-0135H.
FlammabilityRating:ClassUL94-V0I.
ClassificationofMoistureSensitivityperJEDECstandardJ-STD-020-CLevel1J.
SingleLayerThetaJa:110°C/WK.
SingleLayerThetaJc:30°C/WL.
MultiLayerThetaJa:100.
4°C/WM.
MultiLayerThetaJc:30°C/WIV.
DieInformationA.
Dimensions:62X55milsB.
Passivation:Si3N4/SiO2(Siliconnitride/Silicondioxide)C.
Interconnect:Aluminum/Si(Si=1%)D.
BacksideMetallization:NoneE.
MinimumMetalWidth:Metal1-0.
9microns/Metal2-0.
9microns(asdrawn)F.
MinimumMetalSpacing:Metal1-0.
9microns/Metal2-0.
9microns(asdrawn)G.
BondpadDimensions:5mil.
Sq.
H.
IsolationDielectric:SiO2I.
DieSeparationMethod:WaferSawMaximIntegratedProducts.
Allrightsreserved.
Page3/5MAX4614V.
QualityAssuranceInformationA.
QualityAssuranceContacts:'RQ/LSSV(0DQDJHU,ReliabilityEngineering)BryanPreeshl(ManagingDirectorofQA)B.
OutgoingInspectionLevel:0.
1%forallelectricalparametersguaranteedbytheDatasheet.
0.
1%ForallVisualDefects.
C.
ObservedOutgoingDefectRate:<50ppmD.
SamplingPlan:Mil-Std-105DVI.
ReliabilityEvaluationA.
AcceleratedLifeTestTheresultsofthe135biased(static)lifetestareshowninTable1.
Usingtheseresults,theFailureRate()iscalculatedasfollows:=1=6.
21(ChisquarevalueforMTTFupperlimit)MTTF192x4340x160x2(where4340=TemperatureAccelerationfactorassuminganactivationenergyof0.
8eV)=23.
3x10-9=23.
3F.
I.
T.
(60%confidencelevel@25°C)ThefollowingfailureraterepresentsdatacollectedfromMaxim"sreliabilitymonitorprogram.
Maximperformsquarterlylifetestmonitorsonitsprocesses.
ThisdataispublishedintheReliabilityReportfoundathttp://www.
maxim-ic.
com/qa/reliability/monitor.
CumulativemonitordatafortheTS60ProcessresultsinaFITRateof0.
5@25Cand8.
57@55C(0.
8eV,60%UCL)B.
MoistureResistanceTestsTheindustrystandard85°C/85%RHorHASTtestingismonitoredperdeviceprocessonceaquarter.
C.
E.
S.
D.
andLatch-UpTestingTheAH23dietypehasbeenfoundtohaveallpinsabletowithstandaHBMtransientpulseof+/-1000VperMil-Std883Method3015.
7.
Latch-Uptestinghasshownthatthisdevicewithstandsacurrentof+/-250mA.
MaximIntegratedProducts.
Allrightsreserved.
Page4/5MAX4614Table1ReliabilityEvaluationTestResultsMAX4614CUD+TESTITEMTESTCONDITIONFAILUREIDENTIFICATIONSAMPLESIZENUMBEROFFAILURESStaticLifeTest(Note1)Ta=135BiasedTime=192hrs.
DCParameters&functionality1602MoistureTesting(Note2)HASTTa=130°CRH=85%BiasedTime=96hrs.
DCParameters&functionality770MechanicalStress(Note2)TemperatureCycle-65°C/150°C1000CyclesMethod1010DCParameters&functionality770Note1:LifeTestDatamayrepresentplasticDIPqualificationlots.
Note2:GenericPackage/ProcessdataMaximIntegratedProducts.
Allrightsreserved.
Page5/5
SUNNYVALE,CA94086Approvedby'RQ/LSSVQualityAssurance0DQDJHr,ReliabilityEngineeringMaximIntegratedProducts.
Allrightsreserved.
Page1/5MAX4614ConclusionTheMAX4614CUD+successfullymeetsthequalityandreliabilitystandardsrequiredofallMaximproducts.
Inaddition,Maxim"scontinuousreliabilitymonitoringprogramensuresthatalloutgoingproductwillcontinuetomeetMaxim"squalityandreliabilitystandards.
TableofContentsI.
DeviceDescriptionV.
QualityAssuranceInformationII.
ManufacturingInformationVI.
ReliabilityEvaluationIII.
PackagingInformationIV.
DieInformation.
.
.
.
.
AttachmentsI.
DeviceDescriptionA.
GeneralTheMAX4614/MAX4615/MAX4616quad,low-voltage,high-speed,single-pole/single-throw(SPST)analogswitchesarepincompatiblewiththeindustry-standard74HC4066/MAX4610analogswitches.
On-resistance(10max)ismatchedbetweenswitchesto1maxandisflat(1max)overthespecifiedsignalrange.
EachswitchhandlesV+toGNDanalogsignallevels.
Maximumoff-leakagecurrentisonly1nAatTA=+25°Cand6nAatTA=+85°C.
TheMAX4614hasfournormallyopen(NO)switches,andtheMAX4615hasfournormallyclosed(NC)switches.
TheMAX4616hastwoNOswitchesandtwoNCswitches.
TheseCMOSswitchesoperatefromasingle+2Vto+5.
5Vsupply.
Alldigitalinputshave+0.
8Vand+2.
4Vlogicthresholds,ensuringTTL/CMOS-logiccompatibilitywhenusingasingle+5Vsupply.
MaximIntegratedProducts.
Allrightsreserved.
Page2/5MAX4614II.
ManufacturingInformationA.
Description/Function:Low-Voltage,High-Speed,Quad,SPSTCMOSAnalogSwitchesB.
Process:TS60C.
NumberofDeviceTransistors:D.
FabricationLocation:TaiwanE.
AssemblyLocation:Malaysia,Philippines,ThailandF.
DateofInitialProduction:July24,1999III.
PackagingInformationA.
PackageType:14-pinTSSOPB.
LeadFrame:CopperC.
LeadFinish:100%matteTinD.
DieAttach:ConductiveE.
Bondwire:Au(1mildia.
)F.
MoldMaterial:EpoxywithsilicafillerG.
AssemblyDiagram:#05-1201-0135H.
FlammabilityRating:ClassUL94-V0I.
ClassificationofMoistureSensitivityperJEDECstandardJ-STD-020-CLevel1J.
SingleLayerThetaJa:110°C/WK.
SingleLayerThetaJc:30°C/WL.
MultiLayerThetaJa:100.
4°C/WM.
MultiLayerThetaJc:30°C/WIV.
DieInformationA.
Dimensions:62X55milsB.
Passivation:Si3N4/SiO2(Siliconnitride/Silicondioxide)C.
Interconnect:Aluminum/Si(Si=1%)D.
BacksideMetallization:NoneE.
MinimumMetalWidth:Metal1-0.
9microns/Metal2-0.
9microns(asdrawn)F.
MinimumMetalSpacing:Metal1-0.
9microns/Metal2-0.
9microns(asdrawn)G.
BondpadDimensions:5mil.
Sq.
H.
IsolationDielectric:SiO2I.
DieSeparationMethod:WaferSawMaximIntegratedProducts.
Allrightsreserved.
Page3/5MAX4614V.
QualityAssuranceInformationA.
QualityAssuranceContacts:'RQ/LSSV(0DQDJHU,ReliabilityEngineering)BryanPreeshl(ManagingDirectorofQA)B.
OutgoingInspectionLevel:0.
1%forallelectricalparametersguaranteedbytheDatasheet.
0.
1%ForallVisualDefects.
C.
ObservedOutgoingDefectRate:<50ppmD.
SamplingPlan:Mil-Std-105DVI.
ReliabilityEvaluationA.
AcceleratedLifeTestTheresultsofthe135biased(static)lifetestareshowninTable1.
Usingtheseresults,theFailureRate()iscalculatedasfollows:=1=6.
21(ChisquarevalueforMTTFupperlimit)MTTF192x4340x160x2(where4340=TemperatureAccelerationfactorassuminganactivationenergyof0.
8eV)=23.
3x10-9=23.
3F.
I.
T.
(60%confidencelevel@25°C)ThefollowingfailureraterepresentsdatacollectedfromMaxim"sreliabilitymonitorprogram.
Maximperformsquarterlylifetestmonitorsonitsprocesses.
ThisdataispublishedintheReliabilityReportfoundathttp://www.
maxim-ic.
com/qa/reliability/monitor.
CumulativemonitordatafortheTS60ProcessresultsinaFITRateof0.
5@25Cand8.
57@55C(0.
8eV,60%UCL)B.
MoistureResistanceTestsTheindustrystandard85°C/85%RHorHASTtestingismonitoredperdeviceprocessonceaquarter.
C.
E.
S.
D.
andLatch-UpTestingTheAH23dietypehasbeenfoundtohaveallpinsabletowithstandaHBMtransientpulseof+/-1000VperMil-Std883Method3015.
7.
Latch-Uptestinghasshownthatthisdevicewithstandsacurrentof+/-250mA.
MaximIntegratedProducts.
Allrightsreserved.
Page4/5MAX4614Table1ReliabilityEvaluationTestResultsMAX4614CUD+TESTITEMTESTCONDITIONFAILUREIDENTIFICATIONSAMPLESIZENUMBEROFFAILURESStaticLifeTest(Note1)Ta=135BiasedTime=192hrs.
DCParameters&functionality1602MoistureTesting(Note2)HASTTa=130°CRH=85%BiasedTime=96hrs.
DCParameters&functionality770MechanicalStress(Note2)TemperatureCycle-65°C/150°C1000CyclesMethod1010DCParameters&functionality770Note1:LifeTestDatamayrepresentplasticDIPqualificationlots.
Note2:GenericPackage/ProcessdataMaximIntegratedProducts.
Allrightsreserved.
Page5/5
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