exceedios6
ios6 1 时间:2021-02-23 阅读:()
REVISIONSLTRDESCRIPTIONDATE(YR-MO-DA)APPROVEDAAddcaseoutlineX.
Makechangesto1.
2.
4,1.
3,andeditorialchangesthroughout.
96-05-23M.
A.
FRYEBMakechangestodimensionsDandLasspecifiedunderfigure1.
ChangesinaccordancewithNOR5962-R367-97.
97-06-20R.
MONNINCMakechangestodimensionsL,R,andR1asspecifiedunderfigure1.
Redrawn.
ro97-12-01R.
MONNINDDeletedfigure1.
AddedtableIIB.
Updateddrawingtoreflectcurrentrequirements.
-rrp03-03-10R.
MONNINEUpdateboilerplateparagraphstocurrentMIL-PRF-38535requirements.
-ro11-06-16C.
SAFFLEFUpdatedrawingstocurrentMIL-PRF-38535requirements.
-rrp17-06-19C.
SAFFLEREVSHEETREVSHEETREVSTATUSREVFFFFFFFFFFFOFSHEETSSHEET1234567891011PMICN/APREPAREDBYRICKC.
OFFICERDLALANDANDMARITIMECOLUMBUS,OHIO43218-3990http://www.
landandmaritime.
dla.
milSTANDARDMICROCIRCUITDRAWINGTHISDRAWINGISAVAILABLEFORUSEBYALLDEPARTMENTSANDAGENCIESOFTHEDEPARTMENTOFDEFENSECHECKEDBYSANDRAB.
ROONEYAPPROVEDBYMICHAELA.
FRYEMICROCIRCUIT,LINEAR,LOWPOWERDUAL/QUADOPERATIONALAMPLIFIER,MONOLITHICSILICONDRAWINGAPPROVALDATE94-02-16AMSCN/AREVISIONLEVELFSIZEACAGECODE672685962-94534SHEET1OF11DSCCFORM2233APR975962-E403-17DISTRIBUTIONSTATEMENTA.
Approvedforpublicrelease.
Distributionisunlimited.
STANDARDMICROCIRCUITDRAWINGSIZEA5962-94534DLALANDANDMARITIMECOLUMBUS,OHIO43218-3990REVISIONLEVELFSHEET2DSCCFORM2234APR971.
SCOPE1.
1Scope.
Thisdrawingdocumentstwoproductassuranceclasslevelsconsistingofhighreliability(deviceclassQandM)andspaceapplication(deviceclassV).
AchoiceofcaseoutlinesandleadfinishesareavailableandarereflectedinthePartorIdentifyingNumber(PIN).
Whenavailable,achoiceofRadiationHardnessAssurance(RHA)levelsisreflectedinthePIN.
1.
2PIN.
ThePINisasshowninthefollowingexample:5962-9453401MPAFederalstockclassdesignatorRHAdesignator(see1.
2.
1)Devicetype(see1.
2.
2)DeviceclassdesignatorCaseoutline(see1.
2.
4)Leadfinish(see1.
2.
5)\/(see1.
2.
3)\/Drawingnumber1.
2.
1RHAdesignator.
DeviceclassesQandVRHAmarkeddevicesmeettheMIL-PRF-38535specifiedRHAlevelsandaremarkedwiththeappropriateRHAdesignator.
DeviceclassMRHAmarkeddevicesmeettheMIL-PRF-38535,appendixAspecifiedRHAlevelsandaremarkedwiththeappropriateRHAdesignator.
Adash(-)indicatesanon-RHAdevice.
1.
2.
2Devicetype(s).
Thedevicetype(s)identifythecircuitfunctionasfollows:DevicetypeGenericnumberCircuitfunction01LMC6482Lowpowerdualoperationalamplifier02LMC6484Lowpowerquadoperationalamplifier1.
2.
3Deviceclassdesignator.
Thedeviceclassdesignatorisasingleletteridentifyingtheproductassurancelevelasfollows:DeviceclassDevicerequirementsdocumentationMVendorself-certificationtotherequirementsforMIL-STD-883compliant,non-JANclasslevelBmicrocircuitsinaccordancewithMIL-PRF-38535,appendixAQorVCertificationandqualificationtoMIL-PRF-385351.
2.
4Caseoutline(s).
Thecaseoutline(s)areasdesignatedinMIL-STD-1835andasfollows:OutlineletterDescriptivedesignatorTerminalsPackagestyleCGDIP1-T14orCDIP2-T1414DualinlinePGDIP1-T8orCDIP2-T88DualinlineXGDFP1-G1414Flatpackwithgullwingleads1.
2.
5Leadfinish.
TheleadfinishisasspecifiedinMIL-PRF-38535fordeviceclassesQandVorMIL-PRF-38535,appendixAfordeviceclassM.
STANDARDMICROCIRCUITDRAWINGSIZEA5962-94534DLALANDANDMARITIMECOLUMBUS,OHIO43218-3990REVISIONLEVELFSHEET3DSCCFORM2234APR971.
3Absolutemaximumratings.
1/Supplyvoltage(VCC)16VVoltageatinput/outputpinVCC)+0.
3V,(-VCC)-0.
3VCurrentatinputpin5mA2/Currentatoutputpin30mA3/Currentatpowersupplypin40mADifferentialinputvoltageVCCMaximumpowerdissipation(PD):Devicetype01160mWDevicetype02315mWStoragetemperaturerange65°Cto+150°CLeadtemperature(soldering,10seconds)260°CJunctiontemperature(TJ)150°C4/Thermalresistance,junction-to-case(θJC):CaseC12°C/WCaseP16°C/WCaseX11°C/WThermalresistance,junction-to-ambient(θJA):CasesCandP86°C/WCaseX116°C/W1.
4Recommendedoperatingconditions.
Supplyvoltage(+VCC)3.
0V≤+VCC≤15.
5VAmbientoperatingtemperaturerange(TA)55°Cto+125°C_____1/Stressesabovetheabsolutemaximumratingmaycausepermanentdamagetothedevice.
Extendedoperationatthemaximumlevelsmaydegradeperformanceandaffectreliability.
2/Limitinginputpincurrentisonlynecessaryforinputvoltagesthatexceedabsolutemaximuminputvoltageratings.
3/Appliestobothsingle-supplyandspilt-supplyoperation.
Continuousshortcircuitoperationatelevatedambienttemperaturecanresultinexceedingthemaximumallowedjunctiontemperatureof+150°C.
Outputcurrentsinexcessof±30mAoverlongtermmayadverselyaffectreliability.
Donotshortcircuitoutputto+VCC,when+VCCisgreaterthan13Vorreliabilitywillbeadverselyaffected.
4/JunctiontemperaturelimitsapplytopackagessoldereddirectlyintoaPCboard.
STANDARDMICROCIRCUITDRAWINGSIZEA5962-94534DLALANDANDMARITIMECOLUMBUS,OHIO43218-3990REVISIONLEVELFSHEET4DSCCFORM2234APR972.
APPLICABLEDOCUMENTS2.
1Governmentspecification,standards,andhandbooks.
Thefollowingspecification,standards,andhandbooksformapartofthisdrawingtotheextentspecifiedherein.
Unlessotherwisespecified,theissuesofthesedocumentsarethosecitedinthesolicitationorcontract.
DEPARTMENTOFDEFENSESPECIFICATIONMIL-PRF-38535-IntegratedCircuits,Manufacturing,GeneralSpecificationfor.
DEPARTMENTOFDEFENSESTANDARDSMIL-STD-883-TestMethodStandardMicrocircuits.
MIL-STD-1835-InterfaceStandardElectronicComponentCaseOutlines.
DEPARTMENTOFDEFENSEHANDBOOKSMIL-HDBK-103-ListofStandardMicrocircuitDrawings.
MIL-HDBK-780-StandardMicrocircuitDrawings.
(Copiesofthesedocumentsareavailableonlineathttp://quicksearch.
dla.
mil/orfromtheStandardizationDocumentOrderDesk,700RobbinsAvenue,Building4D,Philadelphia,PA19111-5094.
)2.
2Orderofprecedence.
Intheeventofaconflictbetweenthetextofthisdrawingandthereferencescitedherein,thetextofthisdrawingtakesprecedence.
Nothinginthisdocument,however,supersedesapplicablelawsandregulationsunlessaspecificexemptionhasbeenobtained.
3.
REQUIREMENTS3.
1Itemrequirements.
TheindividualitemrequirementsfordeviceclassesQandVshallbeinaccordancewithMIL-PRF-38535asspecifiedherein,orasmodifiedinthedevicemanufacturer'sQualityManagement(QM)plan.
ThemodificationintheQMplanshallnotaffecttheform,fit,orfunctionasdescribedherein.
TheindividualitemrequirementsfordeviceclassMshallbeinaccordancewithMIL-PRF-38535,appendixAfornon-JANclasslevelBdevicesandasspecifiedherein.
3.
2Design,construction,andphysicaldimensions.
Thedesign,construction,andphysicaldimensionsshallbeasspecifiedinMIL-PRF-38535andhereinfordeviceclassesQandVorMIL-PRF-38535,appendixAandhereinfordeviceclassM.
3.
2.
1Caseoutlines.
Thecaseoutlinesshallbeinaccordancewith1.
2.
4herein.
3.
2.
2Terminalconnections.
Theterminalconnectionsshallbeasspecifiedonfigure1.
3.
3Electricalperformancecharacteristicsandpostirradiationparameterlimits.
Unlessotherwisespecifiedherein,theelectricalperformancecharacteristicsandpostirradiationparameterlimitsareasspecifiedintableIandshallapplyoverthefullambientoperatingtemperaturerange.
3.
4Electricaltestrequirements.
TheelectricaltestrequirementsshallbethesubgroupsspecifiedintableIIA.
TheelectricaltestsforeachsubgrouparedefinedintableI.
3.
5Marking.
ThepartshallbemarkedwiththePINlistedin1.
2herein.
Inaddition,themanufacturer'sPINmayalsobemarked.
ForpackageswheremarkingoftheentireSMDPINnumberisnotfeasibleduetospacelimitations,themanufacturerhastheoptionofnotmarkingthe"5962-"onthedevice.
ForRHAproductusingthisoption,theRHAdesignatorshallstillbemarked.
MarkingfordeviceclassesQandVshallbeinaccordancewithMIL-PRF-38535.
MarkingfordeviceclassMshallbeinaccordancewithMIL-PRF-38535,appendixA.
3.
5.
1Certification/compliancemark.
ThecertificationmarkfordeviceclassesQandVshallbea"QML"or"Q"asrequiredinMIL-PRF-38535.
ThecompliancemarkfordeviceclassMshallbea"C"asrequiredinMIL-PRF-38535,appendixA.
STANDARDMICROCIRCUITDRAWINGSIZEA5962-94534DLALANDANDMARITIMECOLUMBUS,OHIO43218-3990REVISIONLEVELFSHEET5DSCCFORM2234APR97TABLEI.
Electricalperformancecharacteristics.
TestSymbolConditions1/-55°C≤TA≤+125°CGroupAsubgroupsDevicetypeLimitsUnitunlessotherwisespecifiedMinMaxInputoffsetvoltageVOS1All0.
75mV2,31.
35InputbiascurrentIIB1All25pA2,3100InputoffsetcurrentIOS1All25pA2,3100CommonmoderejectionratioCMRR0V≤VCM≤15V,1All65dB+VCC=15V2,3620V≤VCM≤5V,165+VCC=5V2,362Positivepowersupplyrejectionratio+PSRR5V≤+VCC≤15V,1All65dBVOUT=+2.
5V2,362-PSRR-5V≤-VCC≤-15V,165VOUT=-2.
5V,+VCC=0V2,362InputcommonmodevoltagerangeVCM5V≤VCM≤15V,1All+VCC+0.
25-0.
25VforCMRR≥50dB2,3+VCC0OutputshortcircuitcurrentISCSourcingVOUT=0V,1All16mA+VCC=5V2,312SinkingVOUT=5V,111+VCC=5V2,39SourcingVOUT=0V,128+VCC=15V2,322SinkingVOUT=12V,2/130+VCC=15V2,324Seefootnotesatendoftable.
STANDARDMICROCIRCUITDRAWINGSIZEA5962-94534DLALANDANDMARITIMECOLUMBUS,OHIO43218-3990REVISIONLEVELFSHEET6DSCCFORM2234APR97TABLEI.
Electricalperformancecharacteristics-Continued.
TestSymbolConditions1/-55°C≤TA≤+125°CGroupAsubgroupsDevicetypeLimitsUnitunlessotherwisespecifiedMinMaxSupplycurrentICC+VCC=5V,bothamps1011.
4mA2,31.
8+VCC=15V,bothamps11.
62,32.
0+VCC=5V,allfouramps1022.
82,33.
6+VCC=15V,allfouramps132,34OutputvoltageswingVO+VCC=5V,4All4.
80.
18VRL=2kto+VCC/25,64.
70.
24+VCC=5V,44.
50.
50RL=600to+VCC/25,64.
240.
65+VCC=15V,414.
40.
32RL=2kto+VCC/25,614.
20.
45+VCC=15V,413.
41.
00RL=600to+VCC/25,613.
01.
30LargesignalvoltagegainAVSourcing,RL=2k,3/4All140V/mV+VCC=15V,7.
5V≤VOUT≤11.
5V5,684Sourcing,RL=600,3/480+VCC=15V,7.
5V≤VOUT≤11.
5V5,648Sinking,RL=2k,3/435+VCC=15V,3.
5V≤VOUT≤7.
5V5,620Sinking,RL=600,3/418+VCC=15V,3.
5V≤VOUT≤7.
5V5,613Seefootnotesatendoftable.
STANDARDMICROCIRCUITDRAWINGSIZEA5962-94534DLALANDANDMARITIMECOLUMBUS,OHIO43218-3990REVISIONLEVELFSHEET7DSCCFORM2234APR97TABLEI.
Electricalperformancecharacteristics-Continued.
TestSymbolConditions1/-55°C≤TA≤+125°CGroupAsubgroupsDevicetypeLimitsUnitunlessotherwisespecifiedMinMaxSlewrateSR±VCC=15V4/4All0.
9V/s5,60.
6GainbandwidthGBW±VCC=15V,setupfor4All1.
25MHznon-inverting5,61.
151/Unlessotherwisespecified,+VCC=5V,-VCC=0V,RL>1M,andVCM=VOUT=+VCC/2.
2/Donotshortcircuitoutputto+VCCwhen+VCCisgreaterthan13Vorreliabilitywillbeadverselyaffected.
3/VCM=7.
5VandRLisconnectedto7.
5V.
4/Connectedasvoltagefollowerwith10Vstepinput,2.
5Vto12.
5Vforpositiveslewrate(+SR)and12.
5to2.
5Vfornegativeslewrate(-SR).
Numberspecifiedistheslowerofeitherthepositiveornegativeslewrates.
3.
6Certificateofcompliance.
FordeviceclassesQandV,acertificateofcomplianceshallberequiredfromaQML-38535listedmanufacturerinordertosupplytotherequirementsofthisdrawing(see6.
6.
1herein).
FordeviceclassM,acertificateofcomplianceshallberequiredfromamanufacturerinordertobelistedasanapprovedsourceofsupplyinMIL-HDBK-103(see6.
6.
2herein).
ThecertificateofcompliancesubmittedtoDLALandandMaritime-VApriortolistingasanapprovedsourceofsupplyforthisdrawingshallaffirmthatthemanufacturer'sproductmeets,fordeviceclassesQandV,therequirementsofMIL-PRF-38535andhereinorfordeviceclassM,therequirementsofMIL-PRF-38535,appendixAandherein.
3.
7Certificateofconformance.
AcertificateofconformanceasrequiredfordeviceclassesQandVinMIL-PRF-38535orfordeviceclassMinMIL-PRF-38535,appendixAshallbeprovidedwitheachlotofmicrocircuitsdeliveredtothisdrawing.
3.
8NotificationofchangefordeviceclassM.
FordeviceclassM,notificationtoDLALandandMaritime-VAofchangeofproduct(see6.
2herein)involvingdevicesacquiredtothisdrawingisrequiredforanychangethataffectsthisdrawing.
3.
9VerificationandreviewfordeviceclassM.
FordeviceclassM,DLALandandMaritime,DLALandandMaritime'sagent,andtheacquiringactivityretaintheoptiontoreviewthemanufacturer'sfacilityandapplicablerequireddocumentation.
Offshoredocumentationshallbemadeavailableonshoreattheoptionofthereviewer.
3.
10MicrocircuitgroupassignmentfordeviceclassM.
DeviceclassMdevicescoveredbythisdrawingshallbeinmicrocircuitgroupnumber49(seeMIL-PRF-38535,appendixA).
STANDARDMICROCIRCUITDRAWINGSIZEA5962-94534DLALANDANDMARITIMECOLUMBUS,OHIO43218-3990REVISIONLEVELFSHEET8DSCCFORM2234APR97Devicetypes0102CaseoutlinesPCandXTerminalnumberTerminalsymbol1OUTPUT1OUTPUT12-INPUT1-INPUT13+INPUT1+INPUT14-VCC+VCC5+INPUT2+INPUT26-INPUT2-INPUT27OUTPUT2OUTPUT28+VCCOUTPUT39----INPUT310---+INPUT311----VCC12---+INPUT413----INPUT414---OUTPUT4FIGURE1.
Terminalconnections.
STANDARDMICROCIRCUITDRAWINGSIZEA5962-94534DLALANDANDMARITIMECOLUMBUS,OHIO43218-3990REVISIONLEVELFSHEET9DSCCFORM2234APR974.
VERIFICATION4.
1Samplingandinspection.
FordeviceclassesQandV,samplingandinspectionproceduresshallbeinaccordancewithMIL-PRF-38535orasmodifiedinthedevicemanufacturer'sQualityManagement(QM)plan.
ThemodificationintheQMplanshallnotaffecttheform,fit,orfunctionasdescribedherein.
FordeviceclassM,samplingandinspectionproceduresshallbeinaccordancewithMIL-PRF-38535,appendixA.
4.
2Screening.
FordeviceclassesQandV,screeningshallbeinaccordancewithMIL-PRF-38535,andshallbeconductedonalldevicespriortoqualificationandtechnologyconformanceinspection.
FordeviceclassM,screeningshallbeinaccordancewithmethod5004ofMIL-STD-883,andshallbeconductedonalldevicespriortoqualityconformanceinspection.
4.
2.
1AdditionalcriteriafordeviceclassM.
a.
Burn-intest,method1015ofMIL-STD-883.
(1)TestconditionA,B,C,orD.
Thetestcircuitshallbemaintainedbythemanufacturerunderdocumentrevisionlevelcontrolandshallbemadeavailabletothepreparingoracquiringactivityuponrequest.
Thetestcircuitshallspecifytheinputs,outputs,biases,andpowerdissipation,asapplicable,inaccordancewiththeintentspecifiedinmethod1015ofMIL-STD-883.
(2)TA=+125°C,minimum.
b.
InterimandfinalelectricaltestparametersshallbeasspecifiedintableIIAherein.
4.
2.
2AdditionalcriteriafordeviceclassesQandV.
a.
Theburn-intestduration,testconditionandtesttemperature,orapprovedalternativesshallbeasspecifiedinthedevicemanufacturer'sQMplaninaccordancewithMIL-PRF-38535.
Theburn-intestcircuitshallbemaintainedunderdocumentrevisionlevelcontrolofthedevicemanufacturer'sTechnologyReviewBoard(TRB)inaccordancewithMIL-PRF-38535andshallbemadeavailabletotheacquiringorpreparingactivityuponrequest.
Thetestcircuitshallspecifytheinputs,outputs,biases,andpowerdissipation,asapplicable,inaccordancewiththeintentspecifiedinmethod1015ofMIL-STD-883.
b.
InterimandfinalelectricaltestparametersshallbeasspecifiedintableIIAherein.
c.
AdditionalscreeningfordeviceclassVbeyondtherequirementsofdeviceclassQshallbeasspecifiedinMIL-PRF-38535,appendixB.
4.
3QualificationinspectionfordeviceclassesQandV.
QualificationinspectionfordeviceclassesQandVshallbeinaccordancewithMIL-PRF-38535.
InspectionstobeperformedshallbethosespecifiedinMIL-PRF-38535andhereinforgroupsA,B,C,D,andEinspections(see4.
4.
1through4.
4.
4).
4.
4Conformanceinspection.
TechnologyconformanceinspectionforclassesQandVshallbeinaccordancewithMIL-PRF-38535includinggroupsA,B,C,D,andEinspections,andasspecifiedherein.
QualityconformanceinspectionfordeviceclassMshallbeinaccordancewithMIL-PRF-38535,appendixAandasspecifiedherein.
InspectionstobeperformedfordeviceclassMshallbethosespecifiedinmethod5005ofMIL-STD-883andhereinforgroupsA,B,C,D,andEinspections(see4.
4.
1through4.
4.
4).
4.
4.
1GroupAinspection.
a.
TestsshallbeasspecifiedintableIIAherein.
b.
Subgroups7,8,9,10,and11intableI,method5005ofMIL-STD-883shallbeomitted.
4.
4.
2GroupCinspection.
ThegroupCinspectionend-pointelectricalparametersshallbeasspecifiedintableIIAherein.
STANDARDMICROCIRCUITDRAWINGSIZEA5962-94534DLALANDANDMARITIMECOLUMBUS,OHIO43218-3990REVISIONLEVELFSHEET10DSCCFORM2234APR97TABLEIIA.
Electricaltestrequirements.
TestrequirementsSubgroups(inaccordancewithMIL-STD-883,method5005,tableI)Subgroups(inaccordancewithMIL-PRF-38535,tableIII)DeviceclassMDeviceclassQDeviceclassVInterimelectricalparameters(see4.
2)111Finalelectricalparameters(see4.
2)1,2,3,4,5,61/1,2,3,4,1/5,61,2,3,4,1/5,6GroupAtestrequirements(see4.
4)1,2,3,4,5,61,2,3,4,5,61,2,3,4,5,6GroupCend-pointelectricalparameters(see4.
4)1,2,31,2,31,2,32/GroupDend-pointelectricalparameters(see4.
4)1,2,31,2,31,2,3GroupEend-pointelectricalparameters(see4.
4)1/PDAappliestosubgroup1.
2/DeltalimitsasspecifiedintableIIBshallberequiredwherespecified,andthedeltalimitsshallbecomputedwithreferencetothepreviousendpointelectricalparameters.
TABLEIIB.
Deltalimits.
TA=+25°C.
ParameterDevicetypeConditionsDeltalimitMinMaxVOS02+VCC=5V,-VCC=0V,RL>1M,VCM=VOUT=+VCC/2+0.
20mV-0.
20mVIIB02+15pA-15pAIOS02+15pA-15pA4.
4.
2.
1AdditionalcriteriafordeviceclassM.
Steady-statelifetestconditions,method1005ofMIL-STD-883:a.
TestconditionA,B,C,orD.
Thetestcircuitshallbemaintainedbythemanufacturerunderdocumentrevisionlevelcontrolandshallbemadeavailabletothepreparingoracquiringactivityuponrequest.
Thetestcircuitshallspecifytheinputs,outputs,biases,andpowerdissipation,asapplicable,inaccordancewiththeintentspecifiedinmethod1005ofMIL-STD-883.
b.
TA=+125°C,minimum.
c.
Testduration:1,000hours,exceptaspermittedbymethod1005ofMIL-STD-883.
STANDARDMICROCIRCUITDRAWINGSIZEA5962-94534DLALANDANDMARITIMECOLUMBUS,OHIO43218-3990REVISIONLEVELFSHEET11DSCCFORM2234APR974.
4.
2.
2AdditionalcriteriafordeviceclassesQandV.
Thesteady-statelifetestduration,testconditionandtesttemperature,orapprovedalternativesshallbeasspecifiedinthedevicemanufacturer'sQMplaninaccordancewithMIL-PRF-38535.
Thetestcircuitshallbemaintainedunderdocumentrevisionlevelcontrolbythedevicemanufacturer'sTRBinaccordancewithMIL-PRF-38535andshallbemadeavailabletotheacquiringorpreparingactivityuponrequest.
Thetestcircuitshallspecifytheinputs,outputs,biases,andpowerdissipation,asapplicable,inaccordancewiththeintentspecifiedinmethod1005ofMIL-STD-883.
4.
4.
3GroupDinspection.
ThegroupDinspectionend-pointelectricalparametersshallbeasspecifiedintableIIAherein.
4.
4.
4GroupEinspection.
GroupEinspectionisrequiredonlyforpartsintendedtobemarkedasradiationhardnessassured(see3.
5herein).
a.
End-pointelectricalparametersshallbeasspecifiedintableIIAherein.
b.
FordeviceclassesQandV,thedevicesortestvehicleshallbesubjectedtoradiationhardnessassuredtestsasspecifiedinMIL-PRF-38535fortheRHAlevelbeingtested.
FordeviceclassM,thedevicesshallbesubjectedtoradiationhardnessassuredtestsasspecifiedinMIL-PRF-38535,appendixAfortheRHAlevelbeingtested.
Alldeviceclassesmustmeetthepostirradiationend-pointelectricalparameterlimitsasdefinedintableIatTA=+25°C±5°C,afterexposure,tothesubgroupsspecifiedintableIIAherein.
5.
PACKAGING5.
1Packagingrequirements.
TherequirementsforpackagingshallbeinaccordancewithMIL-PRF-38535fordeviceclassesQandVorMIL-PRF-38535,appendixAfordeviceclassM.
6.
NOTES6.
1Intendeduse.
MicrocircuitsconformingtothisdrawingareintendedforuseforGovernmentmicrocircuitapplications(originalequipment),designapplications,andlogisticspurposes.
6.
1.
1Replaceability.
Microcircuitscoveredbythisdrawingwillreplacethesamegenericdevicecoveredbyacontractorpreparedspecificationordrawing.
6.
1.
2Substitutability.
DeviceclassQdeviceswillreplacedeviceclassMdevices.
6.
2ConfigurationcontrolofSMD's.
AllproposedchangestoexistingSMD'swillbecoordinatedwiththeusersofrecordfortheindividualdocuments.
ThiscoordinationwillbeaccomplishedusingDDForm1692,EngineeringChangeProposal.
6.
3Recordofusers.
MilitaryandindustrialusersshouldinformDLALandandMaritimewhenasystemapplicationrequiresconfigurationcontrolandwhichSMD'sareapplicabletothatsystem.
DLALandandMaritimewillmaintainarecordofusersandthislistwillbeusedforcoordinationanddistributionofchangestothedrawings.
Usersofdrawingscoveringmicroelectronicdevices(FSC5962)shouldcontactDLALandandMaritime-VA,telephone(614)692-8108.
6.
4Comments.
CommentsonthisdrawingshouldbedirectedtoDLALandandMaritime-VA,Columbus,Ohio43218-3990,ortelephone(614)692-0540.
6.
5Abbreviations,symbols,anddefinitions.
Theabbreviations,symbols,anddefinitionsusedhereinaredefinedinMIL-PRF-38535andMIL-HDBK-1331.
6.
6Sourcesofsupply.
6.
6.
1SourcesofsupplyfordeviceclassesQandV.
SourcesofsupplyfordeviceclassesQandVarelistedinMIL-HDBK-103andQML-38535.
ThevendorslistedinQML-38535havesubmittedacertificateofcompliance(see3.
6herein)toDLALandandMaritime-VAandhaveagreedtothisdrawing.
6.
6.
2ApprovedsourcesofsupplyfordeviceclassM.
ApprovedsourcesofsupplyforclassMarelistedinMIL-HDBK-103.
ThevendorslistedinMIL-HDBK-103haveagreedtothisdrawingandacertificateofcompliance(see3.
6herein)hasbeensubmittedtoandacceptedbyDLALandandMaritime-VA.
STANDARDMICROCIRCUITDRAWINGBULLETINDATE:17-06-19ApprovedsourcesofsupplyforSMD5962-94534arelistedbelowforimmediateacquisitioninformationonlyandshallbeaddedtoMIL-HDBK-103andQML-38535duringthenextrevision.
MIL-HDBK-103andQML-38535willberevisedtoincludetheadditionordeletionofsources.
ThevendorslistedbelowhaveagreedtothisdrawingandacertificateofcompliancehasbeensubmittedtoandacceptedbyDLALandandMaritime-VA.
ThisinformationbulletinissupersededbythenextdatedrevisionofMIL-HDBK-103andQML-38535.
DLALandandMaritimemaintainsanonlinedatabaseofallcurrentsourcesofsupplyathttps://landandmaritimeapps.
dla.
mil/programs/smcr/.
StandardmicrocircuitdrawingPIN1/VendorCAGEnumberVendorsimilarPIN2/5962-9453401MPA01295LMC6482AMJ/8835962-9453402MCA01295LMC6484AMJ/8835962-9453402QXA01295LMC6484AMWG/8835962-9453402VXA3/LMC6484AMWG-QV1/TheleadfinishshownforeachPINrepresentingahermeticpackageisthemostreadilyavailablefromthemanufacturerlistedforthatpart.
Ifthedesiredleadfinishisnotlistedcontactthevendortodetermineitsavailability.
2/Caution.
Donotusethisnumberforitemacquisition.
Itemsacquiredtothisnumbermaynotsatisfytheperformancerequirementsofthisdrawing.
3/Notavailablefromanapprovedsourceofsupply.
VendorCAGEVendornamenumberandaddress01295TexasInstruments,Inc.
SemiconductorGroup8505ForestLn.
POBox660199Dallas,TX75243TheinformationcontainedhereinisdisseminatedforconvenienceonlyandtheGovernmentassumesnoliabilitywhatsoeverforanyinaccuraciesintheinformationbulletin.
Makechangesto1.
2.
4,1.
3,andeditorialchangesthroughout.
96-05-23M.
A.
FRYEBMakechangestodimensionsDandLasspecifiedunderfigure1.
ChangesinaccordancewithNOR5962-R367-97.
97-06-20R.
MONNINCMakechangestodimensionsL,R,andR1asspecifiedunderfigure1.
Redrawn.
ro97-12-01R.
MONNINDDeletedfigure1.
AddedtableIIB.
Updateddrawingtoreflectcurrentrequirements.
-rrp03-03-10R.
MONNINEUpdateboilerplateparagraphstocurrentMIL-PRF-38535requirements.
-ro11-06-16C.
SAFFLEFUpdatedrawingstocurrentMIL-PRF-38535requirements.
-rrp17-06-19C.
SAFFLEREVSHEETREVSHEETREVSTATUSREVFFFFFFFFFFFOFSHEETSSHEET1234567891011PMICN/APREPAREDBYRICKC.
OFFICERDLALANDANDMARITIMECOLUMBUS,OHIO43218-3990http://www.
landandmaritime.
dla.
milSTANDARDMICROCIRCUITDRAWINGTHISDRAWINGISAVAILABLEFORUSEBYALLDEPARTMENTSANDAGENCIESOFTHEDEPARTMENTOFDEFENSECHECKEDBYSANDRAB.
ROONEYAPPROVEDBYMICHAELA.
FRYEMICROCIRCUIT,LINEAR,LOWPOWERDUAL/QUADOPERATIONALAMPLIFIER,MONOLITHICSILICONDRAWINGAPPROVALDATE94-02-16AMSCN/AREVISIONLEVELFSIZEACAGECODE672685962-94534SHEET1OF11DSCCFORM2233APR975962-E403-17DISTRIBUTIONSTATEMENTA.
Approvedforpublicrelease.
Distributionisunlimited.
STANDARDMICROCIRCUITDRAWINGSIZEA5962-94534DLALANDANDMARITIMECOLUMBUS,OHIO43218-3990REVISIONLEVELFSHEET2DSCCFORM2234APR971.
SCOPE1.
1Scope.
Thisdrawingdocumentstwoproductassuranceclasslevelsconsistingofhighreliability(deviceclassQandM)andspaceapplication(deviceclassV).
AchoiceofcaseoutlinesandleadfinishesareavailableandarereflectedinthePartorIdentifyingNumber(PIN).
Whenavailable,achoiceofRadiationHardnessAssurance(RHA)levelsisreflectedinthePIN.
1.
2PIN.
ThePINisasshowninthefollowingexample:5962-9453401MPAFederalstockclassdesignatorRHAdesignator(see1.
2.
1)Devicetype(see1.
2.
2)DeviceclassdesignatorCaseoutline(see1.
2.
4)Leadfinish(see1.
2.
5)\/(see1.
2.
3)\/Drawingnumber1.
2.
1RHAdesignator.
DeviceclassesQandVRHAmarkeddevicesmeettheMIL-PRF-38535specifiedRHAlevelsandaremarkedwiththeappropriateRHAdesignator.
DeviceclassMRHAmarkeddevicesmeettheMIL-PRF-38535,appendixAspecifiedRHAlevelsandaremarkedwiththeappropriateRHAdesignator.
Adash(-)indicatesanon-RHAdevice.
1.
2.
2Devicetype(s).
Thedevicetype(s)identifythecircuitfunctionasfollows:DevicetypeGenericnumberCircuitfunction01LMC6482Lowpowerdualoperationalamplifier02LMC6484Lowpowerquadoperationalamplifier1.
2.
3Deviceclassdesignator.
Thedeviceclassdesignatorisasingleletteridentifyingtheproductassurancelevelasfollows:DeviceclassDevicerequirementsdocumentationMVendorself-certificationtotherequirementsforMIL-STD-883compliant,non-JANclasslevelBmicrocircuitsinaccordancewithMIL-PRF-38535,appendixAQorVCertificationandqualificationtoMIL-PRF-385351.
2.
4Caseoutline(s).
Thecaseoutline(s)areasdesignatedinMIL-STD-1835andasfollows:OutlineletterDescriptivedesignatorTerminalsPackagestyleCGDIP1-T14orCDIP2-T1414DualinlinePGDIP1-T8orCDIP2-T88DualinlineXGDFP1-G1414Flatpackwithgullwingleads1.
2.
5Leadfinish.
TheleadfinishisasspecifiedinMIL-PRF-38535fordeviceclassesQandVorMIL-PRF-38535,appendixAfordeviceclassM.
STANDARDMICROCIRCUITDRAWINGSIZEA5962-94534DLALANDANDMARITIMECOLUMBUS,OHIO43218-3990REVISIONLEVELFSHEET3DSCCFORM2234APR971.
3Absolutemaximumratings.
1/Supplyvoltage(VCC)16VVoltageatinput/outputpinVCC)+0.
3V,(-VCC)-0.
3VCurrentatinputpin5mA2/Currentatoutputpin30mA3/Currentatpowersupplypin40mADifferentialinputvoltageVCCMaximumpowerdissipation(PD):Devicetype01160mWDevicetype02315mWStoragetemperaturerange65°Cto+150°CLeadtemperature(soldering,10seconds)260°CJunctiontemperature(TJ)150°C4/Thermalresistance,junction-to-case(θJC):CaseC12°C/WCaseP16°C/WCaseX11°C/WThermalresistance,junction-to-ambient(θJA):CasesCandP86°C/WCaseX116°C/W1.
4Recommendedoperatingconditions.
Supplyvoltage(+VCC)3.
0V≤+VCC≤15.
5VAmbientoperatingtemperaturerange(TA)55°Cto+125°C_____1/Stressesabovetheabsolutemaximumratingmaycausepermanentdamagetothedevice.
Extendedoperationatthemaximumlevelsmaydegradeperformanceandaffectreliability.
2/Limitinginputpincurrentisonlynecessaryforinputvoltagesthatexceedabsolutemaximuminputvoltageratings.
3/Appliestobothsingle-supplyandspilt-supplyoperation.
Continuousshortcircuitoperationatelevatedambienttemperaturecanresultinexceedingthemaximumallowedjunctiontemperatureof+150°C.
Outputcurrentsinexcessof±30mAoverlongtermmayadverselyaffectreliability.
Donotshortcircuitoutputto+VCC,when+VCCisgreaterthan13Vorreliabilitywillbeadverselyaffected.
4/JunctiontemperaturelimitsapplytopackagessoldereddirectlyintoaPCboard.
STANDARDMICROCIRCUITDRAWINGSIZEA5962-94534DLALANDANDMARITIMECOLUMBUS,OHIO43218-3990REVISIONLEVELFSHEET4DSCCFORM2234APR972.
APPLICABLEDOCUMENTS2.
1Governmentspecification,standards,andhandbooks.
Thefollowingspecification,standards,andhandbooksformapartofthisdrawingtotheextentspecifiedherein.
Unlessotherwisespecified,theissuesofthesedocumentsarethosecitedinthesolicitationorcontract.
DEPARTMENTOFDEFENSESPECIFICATIONMIL-PRF-38535-IntegratedCircuits,Manufacturing,GeneralSpecificationfor.
DEPARTMENTOFDEFENSESTANDARDSMIL-STD-883-TestMethodStandardMicrocircuits.
MIL-STD-1835-InterfaceStandardElectronicComponentCaseOutlines.
DEPARTMENTOFDEFENSEHANDBOOKSMIL-HDBK-103-ListofStandardMicrocircuitDrawings.
MIL-HDBK-780-StandardMicrocircuitDrawings.
(Copiesofthesedocumentsareavailableonlineathttp://quicksearch.
dla.
mil/orfromtheStandardizationDocumentOrderDesk,700RobbinsAvenue,Building4D,Philadelphia,PA19111-5094.
)2.
2Orderofprecedence.
Intheeventofaconflictbetweenthetextofthisdrawingandthereferencescitedherein,thetextofthisdrawingtakesprecedence.
Nothinginthisdocument,however,supersedesapplicablelawsandregulationsunlessaspecificexemptionhasbeenobtained.
3.
REQUIREMENTS3.
1Itemrequirements.
TheindividualitemrequirementsfordeviceclassesQandVshallbeinaccordancewithMIL-PRF-38535asspecifiedherein,orasmodifiedinthedevicemanufacturer'sQualityManagement(QM)plan.
ThemodificationintheQMplanshallnotaffecttheform,fit,orfunctionasdescribedherein.
TheindividualitemrequirementsfordeviceclassMshallbeinaccordancewithMIL-PRF-38535,appendixAfornon-JANclasslevelBdevicesandasspecifiedherein.
3.
2Design,construction,andphysicaldimensions.
Thedesign,construction,andphysicaldimensionsshallbeasspecifiedinMIL-PRF-38535andhereinfordeviceclassesQandVorMIL-PRF-38535,appendixAandhereinfordeviceclassM.
3.
2.
1Caseoutlines.
Thecaseoutlinesshallbeinaccordancewith1.
2.
4herein.
3.
2.
2Terminalconnections.
Theterminalconnectionsshallbeasspecifiedonfigure1.
3.
3Electricalperformancecharacteristicsandpostirradiationparameterlimits.
Unlessotherwisespecifiedherein,theelectricalperformancecharacteristicsandpostirradiationparameterlimitsareasspecifiedintableIandshallapplyoverthefullambientoperatingtemperaturerange.
3.
4Electricaltestrequirements.
TheelectricaltestrequirementsshallbethesubgroupsspecifiedintableIIA.
TheelectricaltestsforeachsubgrouparedefinedintableI.
3.
5Marking.
ThepartshallbemarkedwiththePINlistedin1.
2herein.
Inaddition,themanufacturer'sPINmayalsobemarked.
ForpackageswheremarkingoftheentireSMDPINnumberisnotfeasibleduetospacelimitations,themanufacturerhastheoptionofnotmarkingthe"5962-"onthedevice.
ForRHAproductusingthisoption,theRHAdesignatorshallstillbemarked.
MarkingfordeviceclassesQandVshallbeinaccordancewithMIL-PRF-38535.
MarkingfordeviceclassMshallbeinaccordancewithMIL-PRF-38535,appendixA.
3.
5.
1Certification/compliancemark.
ThecertificationmarkfordeviceclassesQandVshallbea"QML"or"Q"asrequiredinMIL-PRF-38535.
ThecompliancemarkfordeviceclassMshallbea"C"asrequiredinMIL-PRF-38535,appendixA.
STANDARDMICROCIRCUITDRAWINGSIZEA5962-94534DLALANDANDMARITIMECOLUMBUS,OHIO43218-3990REVISIONLEVELFSHEET5DSCCFORM2234APR97TABLEI.
Electricalperformancecharacteristics.
TestSymbolConditions1/-55°C≤TA≤+125°CGroupAsubgroupsDevicetypeLimitsUnitunlessotherwisespecifiedMinMaxInputoffsetvoltageVOS1All0.
75mV2,31.
35InputbiascurrentIIB1All25pA2,3100InputoffsetcurrentIOS1All25pA2,3100CommonmoderejectionratioCMRR0V≤VCM≤15V,1All65dB+VCC=15V2,3620V≤VCM≤5V,165+VCC=5V2,362Positivepowersupplyrejectionratio+PSRR5V≤+VCC≤15V,1All65dBVOUT=+2.
5V2,362-PSRR-5V≤-VCC≤-15V,165VOUT=-2.
5V,+VCC=0V2,362InputcommonmodevoltagerangeVCM5V≤VCM≤15V,1All+VCC+0.
25-0.
25VforCMRR≥50dB2,3+VCC0OutputshortcircuitcurrentISCSourcingVOUT=0V,1All16mA+VCC=5V2,312SinkingVOUT=5V,111+VCC=5V2,39SourcingVOUT=0V,128+VCC=15V2,322SinkingVOUT=12V,2/130+VCC=15V2,324Seefootnotesatendoftable.
STANDARDMICROCIRCUITDRAWINGSIZEA5962-94534DLALANDANDMARITIMECOLUMBUS,OHIO43218-3990REVISIONLEVELFSHEET6DSCCFORM2234APR97TABLEI.
Electricalperformancecharacteristics-Continued.
TestSymbolConditions1/-55°C≤TA≤+125°CGroupAsubgroupsDevicetypeLimitsUnitunlessotherwisespecifiedMinMaxSupplycurrentICC+VCC=5V,bothamps1011.
4mA2,31.
8+VCC=15V,bothamps11.
62,32.
0+VCC=5V,allfouramps1022.
82,33.
6+VCC=15V,allfouramps132,34OutputvoltageswingVO+VCC=5V,4All4.
80.
18VRL=2kto+VCC/25,64.
70.
24+VCC=5V,44.
50.
50RL=600to+VCC/25,64.
240.
65+VCC=15V,414.
40.
32RL=2kto+VCC/25,614.
20.
45+VCC=15V,413.
41.
00RL=600to+VCC/25,613.
01.
30LargesignalvoltagegainAVSourcing,RL=2k,3/4All140V/mV+VCC=15V,7.
5V≤VOUT≤11.
5V5,684Sourcing,RL=600,3/480+VCC=15V,7.
5V≤VOUT≤11.
5V5,648Sinking,RL=2k,3/435+VCC=15V,3.
5V≤VOUT≤7.
5V5,620Sinking,RL=600,3/418+VCC=15V,3.
5V≤VOUT≤7.
5V5,613Seefootnotesatendoftable.
STANDARDMICROCIRCUITDRAWINGSIZEA5962-94534DLALANDANDMARITIMECOLUMBUS,OHIO43218-3990REVISIONLEVELFSHEET7DSCCFORM2234APR97TABLEI.
Electricalperformancecharacteristics-Continued.
TestSymbolConditions1/-55°C≤TA≤+125°CGroupAsubgroupsDevicetypeLimitsUnitunlessotherwisespecifiedMinMaxSlewrateSR±VCC=15V4/4All0.
9V/s5,60.
6GainbandwidthGBW±VCC=15V,setupfor4All1.
25MHznon-inverting5,61.
151/Unlessotherwisespecified,+VCC=5V,-VCC=0V,RL>1M,andVCM=VOUT=+VCC/2.
2/Donotshortcircuitoutputto+VCCwhen+VCCisgreaterthan13Vorreliabilitywillbeadverselyaffected.
3/VCM=7.
5VandRLisconnectedto7.
5V.
4/Connectedasvoltagefollowerwith10Vstepinput,2.
5Vto12.
5Vforpositiveslewrate(+SR)and12.
5to2.
5Vfornegativeslewrate(-SR).
Numberspecifiedistheslowerofeitherthepositiveornegativeslewrates.
3.
6Certificateofcompliance.
FordeviceclassesQandV,acertificateofcomplianceshallberequiredfromaQML-38535listedmanufacturerinordertosupplytotherequirementsofthisdrawing(see6.
6.
1herein).
FordeviceclassM,acertificateofcomplianceshallberequiredfromamanufacturerinordertobelistedasanapprovedsourceofsupplyinMIL-HDBK-103(see6.
6.
2herein).
ThecertificateofcompliancesubmittedtoDLALandandMaritime-VApriortolistingasanapprovedsourceofsupplyforthisdrawingshallaffirmthatthemanufacturer'sproductmeets,fordeviceclassesQandV,therequirementsofMIL-PRF-38535andhereinorfordeviceclassM,therequirementsofMIL-PRF-38535,appendixAandherein.
3.
7Certificateofconformance.
AcertificateofconformanceasrequiredfordeviceclassesQandVinMIL-PRF-38535orfordeviceclassMinMIL-PRF-38535,appendixAshallbeprovidedwitheachlotofmicrocircuitsdeliveredtothisdrawing.
3.
8NotificationofchangefordeviceclassM.
FordeviceclassM,notificationtoDLALandandMaritime-VAofchangeofproduct(see6.
2herein)involvingdevicesacquiredtothisdrawingisrequiredforanychangethataffectsthisdrawing.
3.
9VerificationandreviewfordeviceclassM.
FordeviceclassM,DLALandandMaritime,DLALandandMaritime'sagent,andtheacquiringactivityretaintheoptiontoreviewthemanufacturer'sfacilityandapplicablerequireddocumentation.
Offshoredocumentationshallbemadeavailableonshoreattheoptionofthereviewer.
3.
10MicrocircuitgroupassignmentfordeviceclassM.
DeviceclassMdevicescoveredbythisdrawingshallbeinmicrocircuitgroupnumber49(seeMIL-PRF-38535,appendixA).
STANDARDMICROCIRCUITDRAWINGSIZEA5962-94534DLALANDANDMARITIMECOLUMBUS,OHIO43218-3990REVISIONLEVELFSHEET8DSCCFORM2234APR97Devicetypes0102CaseoutlinesPCandXTerminalnumberTerminalsymbol1OUTPUT1OUTPUT12-INPUT1-INPUT13+INPUT1+INPUT14-VCC+VCC5+INPUT2+INPUT26-INPUT2-INPUT27OUTPUT2OUTPUT28+VCCOUTPUT39----INPUT310---+INPUT311----VCC12---+INPUT413----INPUT414---OUTPUT4FIGURE1.
Terminalconnections.
STANDARDMICROCIRCUITDRAWINGSIZEA5962-94534DLALANDANDMARITIMECOLUMBUS,OHIO43218-3990REVISIONLEVELFSHEET9DSCCFORM2234APR974.
VERIFICATION4.
1Samplingandinspection.
FordeviceclassesQandV,samplingandinspectionproceduresshallbeinaccordancewithMIL-PRF-38535orasmodifiedinthedevicemanufacturer'sQualityManagement(QM)plan.
ThemodificationintheQMplanshallnotaffecttheform,fit,orfunctionasdescribedherein.
FordeviceclassM,samplingandinspectionproceduresshallbeinaccordancewithMIL-PRF-38535,appendixA.
4.
2Screening.
FordeviceclassesQandV,screeningshallbeinaccordancewithMIL-PRF-38535,andshallbeconductedonalldevicespriortoqualificationandtechnologyconformanceinspection.
FordeviceclassM,screeningshallbeinaccordancewithmethod5004ofMIL-STD-883,andshallbeconductedonalldevicespriortoqualityconformanceinspection.
4.
2.
1AdditionalcriteriafordeviceclassM.
a.
Burn-intest,method1015ofMIL-STD-883.
(1)TestconditionA,B,C,orD.
Thetestcircuitshallbemaintainedbythemanufacturerunderdocumentrevisionlevelcontrolandshallbemadeavailabletothepreparingoracquiringactivityuponrequest.
Thetestcircuitshallspecifytheinputs,outputs,biases,andpowerdissipation,asapplicable,inaccordancewiththeintentspecifiedinmethod1015ofMIL-STD-883.
(2)TA=+125°C,minimum.
b.
InterimandfinalelectricaltestparametersshallbeasspecifiedintableIIAherein.
4.
2.
2AdditionalcriteriafordeviceclassesQandV.
a.
Theburn-intestduration,testconditionandtesttemperature,orapprovedalternativesshallbeasspecifiedinthedevicemanufacturer'sQMplaninaccordancewithMIL-PRF-38535.
Theburn-intestcircuitshallbemaintainedunderdocumentrevisionlevelcontrolofthedevicemanufacturer'sTechnologyReviewBoard(TRB)inaccordancewithMIL-PRF-38535andshallbemadeavailabletotheacquiringorpreparingactivityuponrequest.
Thetestcircuitshallspecifytheinputs,outputs,biases,andpowerdissipation,asapplicable,inaccordancewiththeintentspecifiedinmethod1015ofMIL-STD-883.
b.
InterimandfinalelectricaltestparametersshallbeasspecifiedintableIIAherein.
c.
AdditionalscreeningfordeviceclassVbeyondtherequirementsofdeviceclassQshallbeasspecifiedinMIL-PRF-38535,appendixB.
4.
3QualificationinspectionfordeviceclassesQandV.
QualificationinspectionfordeviceclassesQandVshallbeinaccordancewithMIL-PRF-38535.
InspectionstobeperformedshallbethosespecifiedinMIL-PRF-38535andhereinforgroupsA,B,C,D,andEinspections(see4.
4.
1through4.
4.
4).
4.
4Conformanceinspection.
TechnologyconformanceinspectionforclassesQandVshallbeinaccordancewithMIL-PRF-38535includinggroupsA,B,C,D,andEinspections,andasspecifiedherein.
QualityconformanceinspectionfordeviceclassMshallbeinaccordancewithMIL-PRF-38535,appendixAandasspecifiedherein.
InspectionstobeperformedfordeviceclassMshallbethosespecifiedinmethod5005ofMIL-STD-883andhereinforgroupsA,B,C,D,andEinspections(see4.
4.
1through4.
4.
4).
4.
4.
1GroupAinspection.
a.
TestsshallbeasspecifiedintableIIAherein.
b.
Subgroups7,8,9,10,and11intableI,method5005ofMIL-STD-883shallbeomitted.
4.
4.
2GroupCinspection.
ThegroupCinspectionend-pointelectricalparametersshallbeasspecifiedintableIIAherein.
STANDARDMICROCIRCUITDRAWINGSIZEA5962-94534DLALANDANDMARITIMECOLUMBUS,OHIO43218-3990REVISIONLEVELFSHEET10DSCCFORM2234APR97TABLEIIA.
Electricaltestrequirements.
TestrequirementsSubgroups(inaccordancewithMIL-STD-883,method5005,tableI)Subgroups(inaccordancewithMIL-PRF-38535,tableIII)DeviceclassMDeviceclassQDeviceclassVInterimelectricalparameters(see4.
2)111Finalelectricalparameters(see4.
2)1,2,3,4,5,61/1,2,3,4,1/5,61,2,3,4,1/5,6GroupAtestrequirements(see4.
4)1,2,3,4,5,61,2,3,4,5,61,2,3,4,5,6GroupCend-pointelectricalparameters(see4.
4)1,2,31,2,31,2,32/GroupDend-pointelectricalparameters(see4.
4)1,2,31,2,31,2,3GroupEend-pointelectricalparameters(see4.
4)1/PDAappliestosubgroup1.
2/DeltalimitsasspecifiedintableIIBshallberequiredwherespecified,andthedeltalimitsshallbecomputedwithreferencetothepreviousendpointelectricalparameters.
TABLEIIB.
Deltalimits.
TA=+25°C.
ParameterDevicetypeConditionsDeltalimitMinMaxVOS02+VCC=5V,-VCC=0V,RL>1M,VCM=VOUT=+VCC/2+0.
20mV-0.
20mVIIB02+15pA-15pAIOS02+15pA-15pA4.
4.
2.
1AdditionalcriteriafordeviceclassM.
Steady-statelifetestconditions,method1005ofMIL-STD-883:a.
TestconditionA,B,C,orD.
Thetestcircuitshallbemaintainedbythemanufacturerunderdocumentrevisionlevelcontrolandshallbemadeavailabletothepreparingoracquiringactivityuponrequest.
Thetestcircuitshallspecifytheinputs,outputs,biases,andpowerdissipation,asapplicable,inaccordancewiththeintentspecifiedinmethod1005ofMIL-STD-883.
b.
TA=+125°C,minimum.
c.
Testduration:1,000hours,exceptaspermittedbymethod1005ofMIL-STD-883.
STANDARDMICROCIRCUITDRAWINGSIZEA5962-94534DLALANDANDMARITIMECOLUMBUS,OHIO43218-3990REVISIONLEVELFSHEET11DSCCFORM2234APR974.
4.
2.
2AdditionalcriteriafordeviceclassesQandV.
Thesteady-statelifetestduration,testconditionandtesttemperature,orapprovedalternativesshallbeasspecifiedinthedevicemanufacturer'sQMplaninaccordancewithMIL-PRF-38535.
Thetestcircuitshallbemaintainedunderdocumentrevisionlevelcontrolbythedevicemanufacturer'sTRBinaccordancewithMIL-PRF-38535andshallbemadeavailabletotheacquiringorpreparingactivityuponrequest.
Thetestcircuitshallspecifytheinputs,outputs,biases,andpowerdissipation,asapplicable,inaccordancewiththeintentspecifiedinmethod1005ofMIL-STD-883.
4.
4.
3GroupDinspection.
ThegroupDinspectionend-pointelectricalparametersshallbeasspecifiedintableIIAherein.
4.
4.
4GroupEinspection.
GroupEinspectionisrequiredonlyforpartsintendedtobemarkedasradiationhardnessassured(see3.
5herein).
a.
End-pointelectricalparametersshallbeasspecifiedintableIIAherein.
b.
FordeviceclassesQandV,thedevicesortestvehicleshallbesubjectedtoradiationhardnessassuredtestsasspecifiedinMIL-PRF-38535fortheRHAlevelbeingtested.
FordeviceclassM,thedevicesshallbesubjectedtoradiationhardnessassuredtestsasspecifiedinMIL-PRF-38535,appendixAfortheRHAlevelbeingtested.
Alldeviceclassesmustmeetthepostirradiationend-pointelectricalparameterlimitsasdefinedintableIatTA=+25°C±5°C,afterexposure,tothesubgroupsspecifiedintableIIAherein.
5.
PACKAGING5.
1Packagingrequirements.
TherequirementsforpackagingshallbeinaccordancewithMIL-PRF-38535fordeviceclassesQandVorMIL-PRF-38535,appendixAfordeviceclassM.
6.
NOTES6.
1Intendeduse.
MicrocircuitsconformingtothisdrawingareintendedforuseforGovernmentmicrocircuitapplications(originalequipment),designapplications,andlogisticspurposes.
6.
1.
1Replaceability.
Microcircuitscoveredbythisdrawingwillreplacethesamegenericdevicecoveredbyacontractorpreparedspecificationordrawing.
6.
1.
2Substitutability.
DeviceclassQdeviceswillreplacedeviceclassMdevices.
6.
2ConfigurationcontrolofSMD's.
AllproposedchangestoexistingSMD'swillbecoordinatedwiththeusersofrecordfortheindividualdocuments.
ThiscoordinationwillbeaccomplishedusingDDForm1692,EngineeringChangeProposal.
6.
3Recordofusers.
MilitaryandindustrialusersshouldinformDLALandandMaritimewhenasystemapplicationrequiresconfigurationcontrolandwhichSMD'sareapplicabletothatsystem.
DLALandandMaritimewillmaintainarecordofusersandthislistwillbeusedforcoordinationanddistributionofchangestothedrawings.
Usersofdrawingscoveringmicroelectronicdevices(FSC5962)shouldcontactDLALandandMaritime-VA,telephone(614)692-8108.
6.
4Comments.
CommentsonthisdrawingshouldbedirectedtoDLALandandMaritime-VA,Columbus,Ohio43218-3990,ortelephone(614)692-0540.
6.
5Abbreviations,symbols,anddefinitions.
Theabbreviations,symbols,anddefinitionsusedhereinaredefinedinMIL-PRF-38535andMIL-HDBK-1331.
6.
6Sourcesofsupply.
6.
6.
1SourcesofsupplyfordeviceclassesQandV.
SourcesofsupplyfordeviceclassesQandVarelistedinMIL-HDBK-103andQML-38535.
ThevendorslistedinQML-38535havesubmittedacertificateofcompliance(see3.
6herein)toDLALandandMaritime-VAandhaveagreedtothisdrawing.
6.
6.
2ApprovedsourcesofsupplyfordeviceclassM.
ApprovedsourcesofsupplyforclassMarelistedinMIL-HDBK-103.
ThevendorslistedinMIL-HDBK-103haveagreedtothisdrawingandacertificateofcompliance(see3.
6herein)hasbeensubmittedtoandacceptedbyDLALandandMaritime-VA.
STANDARDMICROCIRCUITDRAWINGBULLETINDATE:17-06-19ApprovedsourcesofsupplyforSMD5962-94534arelistedbelowforimmediateacquisitioninformationonlyandshallbeaddedtoMIL-HDBK-103andQML-38535duringthenextrevision.
MIL-HDBK-103andQML-38535willberevisedtoincludetheadditionordeletionofsources.
ThevendorslistedbelowhaveagreedtothisdrawingandacertificateofcompliancehasbeensubmittedtoandacceptedbyDLALandandMaritime-VA.
ThisinformationbulletinissupersededbythenextdatedrevisionofMIL-HDBK-103andQML-38535.
DLALandandMaritimemaintainsanonlinedatabaseofallcurrentsourcesofsupplyathttps://landandmaritimeapps.
dla.
mil/programs/smcr/.
StandardmicrocircuitdrawingPIN1/VendorCAGEnumberVendorsimilarPIN2/5962-9453401MPA01295LMC6482AMJ/8835962-9453402MCA01295LMC6484AMJ/8835962-9453402QXA01295LMC6484AMWG/8835962-9453402VXA3/LMC6484AMWG-QV1/TheleadfinishshownforeachPINrepresentingahermeticpackageisthemostreadilyavailablefromthemanufacturerlistedforthatpart.
Ifthedesiredleadfinishisnotlistedcontactthevendortodetermineitsavailability.
2/Caution.
Donotusethisnumberforitemacquisition.
Itemsacquiredtothisnumbermaynotsatisfytheperformancerequirementsofthisdrawing.
3/Notavailablefromanapprovedsourceofsupply.
VendorCAGEVendornamenumberandaddress01295TexasInstruments,Inc.
SemiconductorGroup8505ForestLn.
POBox660199Dallas,TX75243TheinformationcontainedhereinisdisseminatedforconvenienceonlyandtheGovernmentassumesnoliabilitywhatsoeverforanyinaccuraciesintheinformationbulletin.
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